SigOFIT Optical-fiber Isolated Probe – MOIP Series

Frequently Asked Questions

1 Why is the SigOFIT MOIP Series probe ideal for testing GaN and SiC devices?

The SigOFIT MOIP Series is specifically designed as the best probe for third-generation semiconductors like GaN and SiC. It features real optical isolation technology, ensuring safe testing of GaN devices and presenting true signals with the highest accuracy.

2 What are the key performance specifications of the SigOFIT MOIP Series probes?

The MOIP Series offers models with bandwidths up to 1GHz and exceptional Common Mode Rejection Ratio (CMRR) of 180dB at DC. It supports a wide differential voltage range, with options up to ±6250V, and a common mode voltage range of 85kVpk.

3 In what applications can the SigOFIT Optical-fiber Isolated Probe be used?

The SigOFIT MOIP Series is suitable for a wide range of applications, including the design of motor drives, power converters, and GaN/SiC/IGBT devices. It's also ideal for safety testing in high-voltage, high-bandwidth scenarios, power device evaluation, and troubleshooting EMI & ESD issues.

4 Are there different models available within the SigOFIT MOIP Series, and what are their primary differences?

Yes, the MOIP Series includes several models such as MOIP100P through MOIP1000P, primarily differing in bandwidth, which ranges from 100MHz up to 1GHz. These models also offer various optional differential voltage ranges, accommodating measurements from ±10V up to ±6250V depending on the specific model and option.