SigOFIT Optical-fiber Isolated Probe – MOIP Series

The SigOFIT Optical-fiber Isolated Probe MOIP Series is a cutting-edge solution designed to present true signals with the highest accuracy, making it the best probe for third-generation semiconductors. It safely tests GaN devices using real optical isolation technology, offering a wide measurement range, and is both efficient and affordable. This series is ideal for applications such as motor drive design, power converter development, GaN/SiC/IGBT device testing, inverter/UPS design, high voltage safety tests, power device evaluation, current shunt measurements, EMI & ESD troubleshooting, and floating measurements. Key specifications include models like MOIP100P to MOIP1000P with bandwidths up to 1GHz, rise times as low as ≤350ps, CMRR up to 180dB DC, and differential voltage ranges up to ±6250V.